Talks and Poster Presentations (with Proceedings-Entry):
T. Grasser, H. Reisinger, W. Gös, T. Aichinger, Ph. Hehenberger, P.-J. Wagner, M. Nelhiebel, J. Franco, B. Kaczer:
"Switching Oxide Traps as the Missing Link Between Negative Bias Temperature Instability and Random Telegraph Noise";
Talk: IEEE International Electron Devices Meeting (IEDM),
Baltimore, MD, USA;
2009-12-07
- 2009-12-09; in: "Proceedings of the IEEE International Electron Devices Meeting (IEDM)",
(2009),
1
- 4.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IEDM.2009.5424235
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2009/CP2009_Grasser_12.pdf
Created from the Publication Database of the Vienna University of Technology.