Publications in Scientific Journals:
R. Orio, H. Ceric, S. Selberherr:
"Physically based Models of Electromigration: From Black´s Equation to Modern TCAD Models";
Microelectronics Reliability (invited),
50
(2010),
6;
775
- 789.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2010.01.007
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2010/JB2010_Orio_1.pdf
Created from the Publication Database of the Vienna University of Technology.