Publications in Scientific Journals:
F. Meirer, A. Singh, G. Pepponi, C. Streli, T. Homma, P. Pianetta:
"Synchrotron radiation-induced total reflection X-ray fluorescence analysis";
TrAC - Trends in Analytical Chemistry,
0165
(2010),
9936;
1
- 18.
English abstract:
Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF)
analysis is a high sensitive analytical technique that offers limits of detection
in the femtogram range for most elements. Besides the analytical aspect,
SR-TXRF is mainly used in combination with angle-dependent measurements
and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain
additional information about the investigated sample. In this article, we
briefly discuss the fundamentals of SR-TXRF and follow with several examples
of recent research applying the above-mentioned combination of techniques
to analytical problems arising from industrial applications and
environmental research.
Keywords:
Angle-dependent measurement; GI-XRF; Glancing incident; SR-TXRF; Synchrotron radiation; Total reflection X-ray fluorescence analysis; TXRF; TXRF-XANES; X-ray absorption near-edge structure spectroscopy
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.trac.2010.04.001
Electronic version of the publication:
http://publik.tuwien.ac.at/files/PubDat_187652.pdf
Created from the Publication Database of the Vienna University of Technology.