Talks and Poster Presentations (with Proceedings-Entry):
M. Melik-Merkumians, A. Zoitl, T Moser:
"Ontology-based Fault Diagnosis for Industrial Control Applications";
Talk: IEEE International Conference on Emerging Technologies and Factory Automation (ETFA),
Bilbao, Spanien;
09-13-2010
- 09-16-2010; in: "Proceedings IEEE Emerging Technologies and Factory Automation (ETFA 2010)",
(2010),
ISBN: 978-1-4244-6849-2;
4 pages.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/ETFA.2010.5641192
Electronic version of the publication:
https://publik.tuwien.ac.at/files/publik_188249.pdf
Created from the Publication Database of the Vienna University of Technology.