Talks and Poster Presentations (with Proceedings-Entry):
M. Melik-Merkumians, A. Zoitl, T Moser:
"Ontology-based Fault Diagnosis for Industrial Control Applications";
Talk: IEEE International Conference on Emerging Technologies and Factory Automation (ETFA),
- 2010-09-16; in: "Proceedings IEEE Emerging Technologies and Factory Automation (ETFA 2010)",
Electronic version of the publication:
Created from the Publication Database of the Vienna University of Technology.