Talks and Poster Presentations (with Proceedings-Entry):

M. Melik-Merkumians, A. Zoitl, T Moser:
"Ontology-based Fault Diagnosis for Industrial Control Applications";
Talk: IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), Bilbao, Spanien; 2010-09-13 - 2010-09-16; in: "Proceedings IEEE Emerging Technologies and Factory Automation (ETFA 2010)", (2010), ISBN: 978-1-4244-6849-2; 4 pages.

"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)

Electronic version of the publication:

Created from the Publication Database of the Vienna University of Technology.