Publications in Scientific Journals:
F. Schanovsky, W. Gös, T. Grasser:
"An Advanced Description of Oxide Traps in MOS Transistors and its Relation to DFT";
Journal of Computational Electronics (invited),
9
(2010),
3-4;
135
- 140.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1007/s10825-010-0323-x
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2010/JB2010_Schanovsky_1.pdf
Created from the Publication Database of the Vienna University of Technology.