M. Bodea, J. Pedarnig, T. Withnell, H. W. Weber, D.A. Cardwell, N.H. Babu, A. Koblischka-Veneva:
"Characterization of nano-composite M-2411/Y-123 thin films by electron backscatter diffraction and in-field critical current measurements";
Journal of Physics: Conference Series, 234 (2010), 012006; S. 1 - 5.

Kurzfassung englisch:
Thin films of nano-composite Y-Ba-Cu-O (YBCO) superconductors containing
nano-sized, non-superconducting particles of Y2Ba4CuMOx (M-2411 with M = Ag and Nb)
have been prepared by the PLD technique. Electron backscatter diffraction (EBSD) has been
used to analyze the crystallographic orientation of nano-particles embedded in the film
microstructure. The superconducting YBa2Cu3O7 (Y-123) phase matrix is textured with a
dominant (001) orientation for all samples, whereas the M-2411 phase exhibits a random
orientation. Angular critical current measurements at various temperature (T) and applied
magnetic field (B) have been performed on thin films containing different concentration of the
M-2411 second phase. An increase in critical current density Jc at T < 77 K and B < 6 T is
observed for samples with low concentration of the second phase (2 mol % M-2411). Films
containing 5 mol % Ag-2411 exhibit lower Jc than pure Y-123 thin films at all fields and
temperatures. Samples with 5 mol % Nb-2411 show higher Jc(B) than phase pure Y-123 thin
films for T < 77 K.

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