Talks and Poster Presentations (with Proceedings-Entry):
S. Kuiper, A. J. Fleming, G. Schitter:
"Dual Actuation for High Speed Atomic Force Microscopy";
Talk: 5th IFAC Symposium on Mechatronic Systems,
- 09-15-2010; in: "Proceedings of the 5th IFAC Symposium on Mechatronic Systems",
In atomic force microscopy (AFM) the imaging speed is strongly limited by the bandwidth of
the feedback loop that controls the interaction between the measurement tip and the sample.
A significant increase in closed-loop bandwidth can be achieved by combining a long-range,
low-bandwidth actuator with a short-range, high-bandwidth actuator, forming a dual actuated
system. This contribution discusses the design of a model-based feedback controller that controls
the tip-sample interaction in dual actuated AFM. In order to guarantee closed-loop stability, the
dynamic uncertainties of the system are identified and taken into account in the controller design.
Two different design cases are discussed, showing the trade-off between the positioning range
at lower frequencies and the positioning range at higher frequencies. The designed feedback
controller is implemented on the prototype AFM system and demonstrates a disturbance
rejection bandwidth of 20 kHz.
Atomic Force Microscopy, model-based control, piezoelectric actuator, dual actuation.
Created from the Publication Database of the Vienna University of Technology.