Talks and Poster Presentations (with Proceedings-Entry):
S. Kuiper, A. J. Fleming, G. Schitter:
"Dual Actuation for High Speed Atomic Force Microscopy";
Talk: 5th IFAC Symposium on Mechatronic Systems,
Boston, USA;
09-13-2010
- 09-15-2010; in: "Proceedings of the 5th IFAC Symposium on Mechatronic Systems",
(2010),
220
- 226.
English abstract:
In atomic force microscopy (AFM) the imaging speed is strongly limited by the bandwidth of
the feedback loop that controls the interaction between the measurement tip and the sample.
A significant increase in closed-loop bandwidth can be achieved by combining a long-range,
low-bandwidth actuator with a short-range, high-bandwidth actuator, forming a dual actuated
system. This contribution discusses the design of a model-based feedback controller that controls
the tip-sample interaction in dual actuated AFM. In order to guarantee closed-loop stability, the
dynamic uncertainties of the system are identified and taken into account in the controller design.
Two different design cases are discussed, showing the trade-off between the positioning range
at lower frequencies and the positioning range at higher frequencies. The designed feedback
controller is implemented on the prototype AFM system and demonstrates a disturbance
rejection bandwidth of 20 kHz.
Keywords:
Atomic Force Microscopy, model-based control, piezoelectric actuator, dual actuation.
Created from the Publication Database of the Vienna University of Technology.