Publications in Scientific Journals:
T. Grasser, H. Reisinger, P.-J. Wagner, B. Kaczer:
"Time-Dependent Defect Spectroscopy for Characterization of Border Traps in Metal-Oxide-Semiconductor Transistors";
Physical Review B,
82
(2010),
245318-1
- 245318-10.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1103/PhysRevB.82.245318
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2010/JB2010_Grasser_3.pdf
Created from the Publication Database of the Vienna University of Technology.