Talks and Poster Presentations (with Proceedings-Entry):
T. Grasser, B. Kaczer, W. Gös, H. Reisinger, T. Aichinger, Ph. Hehenberger, P.-J. Wagner, F. Schanovsky, J. Franco, Ph. J. Roussel, M. Nelhiebel:
"Recent Advances in Understanding the Bias Temperature Instability";
Talk: IEEE International Electron Devices Meeting (IEDM),
San Francisco, CA, USA (invited);
2010-12-06
- 2010-12-08; in: "Proceedings of the IEEE International Electron Devices Meeting (IEDM)",
(2010),
82
- 85.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IEDM.2010.5703295
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2010/CP2010_Grasser_2.pdf
Created from the Publication Database of the Vienna University of Technology.