Contributions to Books:
W. Gös, F. Schanovsky, Ph. Hehenberger, P.-J. Wagner, T. Grasser:
"Charge Trapping and the Negative Bias Temperature Instability";
in: "Physics and Technology of High-k Materials 8",
ECS Transactions,
2010, (invited),
ISBN: 978-1-56677-822-0,
565
- 589.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1149/1.3481647
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2010/BC2010_Goes_1.pdf
Created from the Publication Database of the Vienna University of Technology.