[Zurück]

G. Requena, P. Cloetens, W. Altendorfer, C. Poletti, D. Tolnai, F. Warchomicka, H.P. Degischer:
"Sub-micrometer holotomography of multiphase metals";
Poster: Journées Annuelles de la SF2M 2010, Paris, Frankreich; 22.06.2010 - 24.06.2010.

nicht vorhanden

Synchrotron microtomography has shown to be a powerful technique to reveal the internal architecture of materials. Furthermore, the coherence of the beam can be exploited applying quantitative phase contrast tomography or holotomography [1] to image components with similar attenuation. The spatial resolution achievable by parallel beam synchrotron microtomography is about 1 µm. This can be improved using magnifying optics. We present results obtained by magnified synchrotron holotomography using a Kirkpatrick-Baez (KB) optics system [2]. The experiments were carried out at the nano-imaging end-station ID22NI for Al- and Ti-based materials using samples with 0.4mm diameter. The focal point with a size of 80 nm (H) by 130 nm (V) and medium monochromaticity (E/E = 2x10-2) is produced by a set of multilayer coated crossed bent mirrors. Energies of 17.5 keV and 29 keV as well as effective pixel sizes of 60 nm and 51 nm were used for the Al- Ti-based materials, respectively. Phase retrieval for holotomography was achieved from recordings at four focal-point-to-sample distances. Microstructural features as small as  180 nm are detected in an AlMg7Si4 alloy, a SiC particle reinforced AlCu4 alloy, a near beta Ti-10V-2Fe-3Al alloy, and in a TiB reinforced alpha+beta Ti-6Al-4V alloy

Synchrotron tomography, KB optics, holotomography

http://publik.tuwien.ac.at/files/PubDat_192038.doc