Talks and Poster Presentations (with Proceedings-Entry):

T. Reinbacher, J. Brauer, M. Horauer, A. Steininger, S. Kowalewski:
"Test-Case Generation for Embedded Binary Code Using Abstract Interpretation";
Talk: MEMICS 2010 (Mathematical and Engineering Methods in Computer Science), Mikulov, Czech Republic; 2010-10-22 - 2010-10-24; in: "MEMICS proceedings", (2010), 151 - 158.

English abstract:
This paper describes a framework for test-case generation for microcontroller binary programs using abstract interpretation techniques. The key idea of our approach is to derive program invariants a priori, and then use backward analysis to obtain test vectors that are executed on the target microcontroller. Due to the structure of binary code, the abstract interpretation framework is based on propositional encodings of the program semantics and SAT solving.

Test-case generation, binary code, abstract interpretation

Related Projects:
Project Head Andreas Steininger:
Framework für CounterExample Validierung und Testfallgenerierung für die Verifikation von eingebetteter Software

Created from the Publication Database of the Vienna University of Technology.