[Back]

G. Kowarik, E. Gruber, K. Iskratsch, F. Aumayr:
"Using a current method for measuring ion-induced electron emission from LiF";
Nuclear Instruments & Methods in Physics Research Section B, 269 (2011), 964 - 967.

The interaction of ions with an insulating substrate leads to surface charging. For intense ion beams these
charges are not sufficiently fast removed between successive ion impact events. As a result the trajectories
of the incident beam and the electron emission yield may be altered in a hardly predictable way. We
demonstrate, that by heating an alkali-halide sample to a sufficiently high temperature, this macroscopic
charging can be avoided and a simple current method can be used to study electron emission from such a
surface. Measured electron emission yields from a LiF(1 0 0) single crystal due to impact of singly and
multiply charged heavy noble gas ions (argon and xenon) are presented. For argon projectiles our results
compare well with previous data, which were obtained using a more sophisticated electron statistics
method and six orders of magnitude less intense ion beams.
2010