Publications in Scientific Journals:
I. Starkov, S. E. Tyaginov, H. Enichlmair, J. Cervenka, C. Jungemann, S. Carniello, J.M. Park, H. Ceric, T. Grasser:
"Hot-Carrier Degradation Caused Interface State Profile-Simulation versus Experiment";
Journal of Vacuum Science & Technology B,
29
(2011),
01AB09-1
- 01AB09-8.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1116/1.3534021
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2010/JB2011_Starkov_2.pdf
Created from the Publication Database of the Vienna University of Technology.