Talks and Poster Presentations (with Proceedings-Entry):
Ph. Hehenberger, H. Reisinger, T. Grasser:
"Recovery of Negative and Positive Bias Temperature Stress in pMOSFETs";
Talk: IEEE International Integrated Reliability Workshop,
California;
10-17-2010
- 10-21-2010; in: "Final Report of IEEE International Integrated Reliability Workshop",
(2010),
8
- 11.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IIRW.2010.5706473
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2010/CP2010_Hehenberger_1.pdf
Created from the Publication Database of the Vienna University of Technology.