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Talks and Poster Presentations (with Proceedings-Entry):

Ph. Hehenberger, H. Reisinger, T. Grasser:
"Recovery of Negative and Positive Bias Temperature Stress in pMOSFETs";
Talk: IEEE International Integrated Reliability Workshop, California; 10-17-2010 - 10-21-2010; in: "Final Report of IEEE International Integrated Reliability Workshop", (2010), 8 - 11.



"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IIRW.2010.5706473

Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2010/CP2010_Hehenberger_1.pdf


Created from the Publication Database of the Vienna University of Technology.