Talks and Poster Presentations (with Proceedings-Entry):
M. F. Bukhori, T. Grasser, B. Kaczer, H. Reisinger, A. Asenov:
"'Atomistic' Simulation of RTS Amplitudes Due to Single and Multiple Charged Defect States and Their Interactions";
Talk: IEEE International Integrated Reliability Workshop,
California;
10-17-2010
- 10-21-2010; in: "Final Report of IEEE International Integrated Reliability Workshop",
(2010),
76
- 79.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IIRW.2010.5706490
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2010/CP2010_Grasser_4.pdf
Created from the Publication Database of the Vienna University of Technology.