Publications in Scientific Journals:
M. Karner, A. Gehring, M. Wagner, R. Entner, S. Holzer, W. Gös, M. Vasicek, T. Grasser, H. Kosina, S. Selberherr:
"VSP - A Gate Stack Analyzer";
Microelectronics Reliability,
47
(2007),
4-5;
704
- 708.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2007.01.059
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2006/JB2007_Karner_1.pdf
Created from the Publication Database of the Vienna University of Technology.