Publications in Scientific Journals:
S. E. Tyaginov, I. Starkov, O. Triebl, J. Cervenka, C. Jungemann, S. Carniello, J.M. Park, H. Enichlmair, M. Karner, C. Kernstock, E. Seebacher, R. Minixhofer, H. Ceric, T. Grasser:
"Interface Traps Density-of-States as a Vital Component for Hot-Carrier Degradation Modeling";
Microelectronics Reliability,
50
(2010),
1267
- 1272.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2010.0
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2010/JB2010_Tyaginov_1.pdf
Created from the Publication Database of the Vienna University of Technology.