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Publications in Scientific Journals:

S. E. Tyaginov, I. Starkov, O. Triebl, J. Cervenka, C. Jungemann, S. Carniello, J.M. Park, H. Enichlmair, M. Karner, C. Kernstock, E. Seebacher, R. Minixhofer, H. Ceric, T. Grasser:
"Interface Traps Density-of-States as a Vital Component for Hot-Carrier Degradation Modeling";
Microelectronics Reliability, 50 (2010), 1267 - 1272.



"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2010.0

Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2010/JB2010_Tyaginov_1.pdf


Created from the Publication Database of the Vienna University of Technology.