Contributions to Books:
S. E. Tyaginov, I. Starkov, H. Enichlmair, J.M. Park, C. Jungemann, T. Grasser:
"Physics-Based Hot-Carrier Degradation Models";
in: "Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics 11",
R. Sah (ed.);
ECS Transactions,
2011,
ISBN: 978-1-56677-865-7,
321
- 352.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1149/1.3572292
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2010/BC2011_Tyaginov_1.pdf
Created from the Publication Database of the Vienna University of Technology.