Publications in Scientific Journals:
M. Toledano-Luque, B. Kaczer, Ph. J. Roussel, M. Cho, T. Grasser, G. Groeseneken:
"Temperature Dependence of the Emission and Capture Times of SiON Individual Traps after Positive Bias Temperature Stress";
Journal of Vacuum Science & Technology B,
29
(2011),
01AA04-1
- 01AA04-5.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1116/1.3532947
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2010/JB2011_Grasser_2.pdf
Created from the Publication Database of the Vienna University of Technology.