Talks and Poster Presentations (with Proceedings-Entry):
J. Franco, B. Kaczer, G. Eneman, Ph. J. Roussel, M. Cho, J. Mitard, L. Witters, T. Y. Hoffmann, G. Groeseneken, F. Crupi, T. Grasser:
"On the Recoverable and Permanent Components of Hot Carrier and NBTI in Si pMOSFETs and their Implications in Si0.45Ge0.55 pMOSFETs";
Talk: International Reliability Physics Symposium (IRPS),
Monterey;
2011-04-12
- 2011-04-14; in: "Proceedings of the International Reliability Physics Symposium (IRPS)",
(2011),
6 pages.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IRPS.2011.5784545
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2010/CP2011_Grasser_1.pdf
Created from the Publication Database of the Vienna University of Technology.