Editorials in Scientific Journals:
E. Sangiorgi, A. Asenov, H. Bennett, R. Dutton, D. Esseni, M. Giles, M. Hane, K. Nishi, J. Ranaweera, S. Selberherr:
"Foreword Special Issue on Characterization of Nano CMOS Variability by Simulation and Measurements";
IEEE Transactions on Electron Devices,
58
(2011),
8;
2190
- 2196.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TED.2011.2160884
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2014/JB2014_Selberherr_1.pdf
Created from the Publication Database of the Vienna University of Technology.