S. Kuiper, G. Schitter:
"Improving the Imaging Speed of AFM with Modern Control Techniques";
in: "Control Technologies for Emerging Micro and Nanoscale Systems", Springer-Verlag, Berlin-Heidelberg, Berlin-Heidelberg, 2011, ISBN: 978-3-642-22172-9, S. 83 - 100.

Kurzfassung englisch:
In Atomic Force Microscopy (AFM), the dynamics and non-linearities of the positioning stage are major sources of image artifacts and distortion, especially when imaging at high-speed. This contribution discusses some recent development to compensate for these adverse effects of the positioning stage dynamics in high-speed AFM by utilizing modern control methods. The improvements on both the lateral scanning motion and in controlling the tip-sample interaction force are demonstrated to allow significantly faster, and more accurate AFM imaging.

"Offizielle" elektronische Version der Publikation (entsprechend ihrem Digital Object Identifier - DOI)

Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.