Publications in Scientific Journals:
T. Grasser:
"Stochastic Charge Trapping in Oxides: From Random Telegraph Noise to Bias Temperature Instabilities";
Microelectronics Reliability (invited),
52
(2012),
1;
39
- 70.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2011.09.002
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2011/JB2011_Grasser_5.pdf
Created from the Publication Database of the Vienna University of Technology.