Publications in Scientific Journals:
I. Starkov, S. E. Tyaginov, H. Enichlmair, J.M. Park, H. Ceric, T. Grasser:
"Accurate Extraction of MOSFET Unstressed Interface State Spatial Distribution from Charge Pumping Measurements";
Solid State Phenomena,
178-179
(2011),
267
- 272.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.4028/www.scientific.net/SSP.178-179.267
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2011/JB2011_Starkov_1.pdf
Created from the Publication Database of the Vienna University of Technology.