Talks and Poster Presentations (with Proceedings-Entry):
I. Starkov, H. Ceric, S. E. Tyaginov, T. Grasser:
"Analysis of Worst-Case Hot-Carrier Conditions for n-type MOSFET";
Talk: 7th Conference on PhD Research in Microelectronics and Electronics (PRIME),
Madonna di Campiglio, Italy;
2011-07-03
- 2011-07-07; in: "Proceedings of the 7th Conference on PhD Research in Microelectronics and Electronics",
(2011),
ISBN: 978-1-4244-9136-0;
4 pages.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/PRIME.2011.5966251
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2011/CP2011_Starkov_3.pdf
Created from the Publication Database of the Vienna University of Technology.