Publications in Scientific Journals:
S. E. Tyaginov, I. Starkov, H. Enichlmair, C. Jungemann, J.M. Park, E. Seebacher, R. Orio, H. Ceric, T. Grasser:
"An Analytical Approach for Physical Modeling of Hot-Carrier Induced Degradation";
Microelectronics Reliability,
51
(2011),
1525
- 1529.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2011.07.089
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2011/JB2011_Grasser_2.pdf
Created from the Publication Database of the Vienna University of Technology.