Talks and Poster Presentations (with Proceedings-Entry):
R. Orio, S. Selberherr:
"Compact Modeling of Interconnect Reliability";
Talk: Conference on Electron Devices and Solid-State Circuits (EDSSC),
Tianjin, China (invited);
2011-11-17
- 2011-11-18; in: "Proc. IEEE Conference on Electron Devices and Solid-State Circuits EDSSC",
(2011),
ISBN: 978-1-4577-1998-1;
2 pages.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/EDSSC.2011.6117564
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2011/CP2011_Orio_2.pdf
Created from the Publication Database of the Vienna University of Technology.