Publications in Scientific Journals:
S. E. Tyaginov, M. Vexler, A. El Hdiy, K. Gacem, V Zaporojtchenko:
"Electrical Methods for Estimating the Correlation Length of Insulator Thickness Fluctuations in MIS Tunnel Structures";
Materials Science in Semiconductor Processing,
13
(2010),
405
- 410.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.mssp.2011.07.003
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2011/JB2011_Tyaginov_1.pdf
Created from the Publication Database of the Vienna University of Technology.