Talks and Poster Presentations (with Proceedings-Entry):
H. Ceric, R. Orio, S. Selberherr:
"Integration of Atomistic and Continuum-Level Electromigration Models";
Poster: IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Incheon, South Korea;
2011-07-04
- 2011-07-07; in: "IPFA 2011 Proceedings",
(2011),
ISBN: 978-1-4577-0159-7;
4 pages.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IPFA.2011.5992749
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2011/CP2011_Ceric_2.pdf
Created from the Publication Database of the Vienna University of Technology.