Talks and Poster Presentations (with Proceedings-Entry):
T. Grasser, P.-J. Wagner, H. Reisinger, T. Aichinger, G. Pobegen, M. Nelhiebel, B. Kaczer:
"Analytic Modeling of the Bias Temperature Instability Using Capture/Emission Time Maps";
Talk: IEEE International Electron Devices Meeting (IEDM),
Washington DC, USA;
2011-12-05
- 2011-12-07; in: "Proceedings of the IEEE International Electron Devices Meeting (IEDM)",
(2011),
ISBN: 978-1-4577-0505-2;
4 pages.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IEDM.2011.6131624
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2011/CP2011_Grasser_2.pdf
Created from the Publication Database of the Vienna University of Technology.