Doctor's Theses (authored and supervised):
W. Gös:
"Hole Trapping and the Negative Bias Temperature Instability";
Supervisor, Reviewer: T. Grasser, D. Süss;
Institut für Mikroelektronik,
2011;
oral examination: 2012-12-22.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.34726/hss.2011.25057
Electronic version of the publication:
http://www.iue.tuwien.ac.at/phd/goes/
Created from the Publication Database of the Vienna University of Technology.