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C. Schanes, F. Fankhauser, S. Taber, T. Grechenig:
"Generic data format approach for generation of security test data";
Vortrag: The Third International Conference on Advances in System Testing and Validation Lifecycle, Barcelona, Spain; 23.10.2011 - 28.10.2011; in: "Proceedings of the Third International Conference on Advances in System Testing and Validation Lifecycle", IARIA, 2011 (2011), ISBN: 978-1-61208-168-7; S. 103 - 108.

Security testing is an important and at the same
time also expensive task for developing robust and secure
systems. Test automation can reduce costs of security tests
and increase test coverage and, therefore, increase the number
of detected security issues during development. A common
data format as the basis for specific test cases ensures that
the implementation of the generation logic for security test
data is only needed once and can be used for various data
formats by transforming the data to the common data format,
generating the test data and transforming back to the original
data format. The introduced approach enables to generate test
data for various formats using a single implementation of the
generation algorithm and applying the results for specific test
cases in different data formats.