Talks and Poster Presentations (with Proceedings-Entry):
T. Grasser:
"Recent Developments in Understanding the Bias Temperature Instability";
Talk: International Conference on Microelectronics (MIEL),
Nis, Serbia (invited);
2012-05-13
- 2012-05-16; in: "Proceedings of the International Conference on Microelectronics (MIEL)",
(2012),
ISBN: 978-1-4673-0238-8;
315
- 322.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/MIEL.2012.6222864
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2011/CP2012_Grasser_7.pdf
Created from the Publication Database of the Vienna University of Technology.