Publications in Scientific Journals:
H. Ceric, R. Orio, S. Selberherr:
"Interconnect Reliability Dependence on Fast Diffusivity Paths";
Microelectronics Reliability (invited),
52
(2012),
8;
1532
- 1538.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2011.09.035
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2012/JB2012_Ceric_1.pdf
Created from the Publication Database of the Vienna University of Technology.