Talks and Poster Presentations (with Proceedings-Entry):
H. Ceric, R. Orio, W. H. Zisser, S. Selberherr:
"Ab Initio Method for Electromigration Analysis";
Talk: IEEE Electronics Packaging Technology Conference (EPTC),
Singapore;
2012-07-02
- 2012-07-06; in: "Proceedings of the 19th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits",
(2012),
ISBN: 978-1-4673-0982-0;
4 pages.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IPFA.2012.6306306
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2012/CP2012_Ceric_1.pdf
Created from the Publication Database of the Vienna University of Technology.