Publications in Scientific Journals:
M. Toledano-Luque, B. Kaczer, J. Franco, Ph. J. Roussel, T. Grasser, G. Groeseneken:
"Defect-Centric Perspective of Time-Dependent BTI Variability";
Microelectronics Reliability,
52
(2012),
9-10;
1883
- 1890.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2012.06.120
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2012/JB2012_Grasser_1.pdf
Created from the Publication Database of the Vienna University of Technology.