Publications in Scientific Journals:
K. Rott, H. Reisinger, S. Aresu, C. Schlünder, K. Kölpin, W. Gustin, T. Grasser:
"New Insights on the PBTI Phenomena in SiON pMOSFETs";
Microelectronics Reliability,
52
(2012),
9-10;
1891
- 1894.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2012.06.015
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2012/JB2012_Grasser_2.pdf
Created from the Publication Database of the Vienna University of Technology.