S. Abbas, A. Wagh, H. Lemmel, T. Potocar, H. Rauch:
"High-precision determination of Si-neutron coherent scattering length with a dual non-dispersive sample.";
AIP Conference Proceedings, 1447 (2012), S. 479 - 480.

Kurzfassung englisch:
We report here our new interferometric measurements of neutron coherent scattering length bC for silicon using a better polished dual non-dispersive sample. We have measured a large and exactly non-dispersive phase by this method to within 1 part in 10^6 and determined the silicon bC to within a few parts in 10^5.

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