Contributions to Proceedings:

M. Hofbauer, K. Schweiger, H. Dietrich, H. Zimmermann, U. Schmid, B Merk:
"Single Event Effect Measurements in 90nm CMOS Circuits at the Microbeam Facility for the Project FATAL";
in: "GSI Scientific Report 2011", GSI Helmholtzzentrum für Schwerionenforschung GmbH, Darmstadt, 2012, ISSN: 0174-0814, 424.

Created from the Publication Database of the Vienna University of Technology.