Talks and Poster Presentations (with Proceedings-Entry):

H. W. Yoo, M. Verhaegen, M. E. von Royen, G. Schitter:
"Automated Adjustment of Aberration Correction in Scanning Confocal Microscopy";
Talk: IEEE International Instrumentation and Measurement Technology Conference (2012 I2MTC), Graz; 05-13-2012 - 05-16-2012; in: "Proceedings on IEEE Instrumentation and Measurement Technology Conference (I2MTC)", (2012), 6 pages.

English abstract:
This contribution demonstrates an automated adjustment
of the coverslip correction collar in scanning confocal
microscopy to compensate for aberrations caused by coverslip
thickness mismatch. An axial image model is derived for filtering
the measured axial image to improve the signal to noise ratio. To
find the best collar alignment, 70 axial scans equally spaced over
the actuation range are recorded and evaluated automatically.
The axial scans reveal that different coverslips have a shift of the
maximum intensity for optimal imaging along the collar angle.
Correction quality such as the maximum intensity or sharpness of
the image are examined and used to find the optimal adjustment.
The proposed automated correction is demonstrated with two
different coverslips and two biological specimen showing the
improved resolution of the obtained confocal microscopy images.

Created from the Publication Database of the Vienna University of Technology.