Talks and Poster Presentations (with Proceedings-Entry):

H. W. Yoo, S. Ito, M. Verhaegen, G. Schitter:
"Iterative Learning Control of a Galvanometer Scanner for Fast and Accurate Scanning Laser Microscopy";
Talk: Mechatronics 2012, Linz; 09-17-2012 - 09-29-2012; in: "Proceedings on Mechartonics 2012", (2012), ISBN: 978-3-99033-045-6; 537 - 543.

English abstract:
Iterative learning control (ILC) for a galvanometer
scanner is proposed to achieve a high speed, linear, and accurate
bidirectional scanning for scanning laser microscopy. Two stable
inversion methods, zero phase shifts and phase fitting by input
delays, are used for designing stable ILCs enabling a wide
control bandwidth. Based on the measured Bode plot, models of
a galvanometer scanner are obtained for each ILC. Experimental
results verify the benefits of ILCs allowing a faster, more
linear and accurate scanning without a phase lag and a gain
mismatch and achieving up to a 73 times smaller root mean
square (RMS) error than a conventional feedback controller. An
imaging simulation based on the experimental data shows that
the proposed ILCs provide an image with less distortion than
the conventional feedback controller.

Created from the Publication Database of the Vienna University of Technology.