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Vorträge und Posterpräsentationen (mit Tagungsband-Eintrag):

M.N. Durakbasa, J.M. Bauer, G. Bas:
"Developments in High Precision Metrology for Advanced Manufacturing";
Hauptvortrag: Manufacturing Engineering and Management, Presov, Slovak Republic (eingeladen); 05.12.2012 - 07.12.2012; in: "Proceedings of 2nd International Conference on MANUFACTURING ENGINEERING & MANAGEMENT 2012", S. Hloch et al. (Hrg.); FVT TU in Kosice with a seat in Presov, STEVEPRESS, Ltd., Presov, Slovak Republic (2012), 978‐80‐553‐1216‐3; S. 210 - 215.



Kurzfassung englisch:
The application of intelligent technologies also puts appropriate demands on production engineering in
modern industrial environment. A sophisticated high‐accuracy measurement technique can be considered
as most crucial requirement for the production of industrial goods and for the production processes of high
quality. High accuracy workpieces are created nowadays by a large variety of advanced manufacturing
system and techniques. The problematic of the high accuracy of the work pieces in modern industrial
production gained in the last years more and more importance through constantly increasing demands on
the quality of the produced parts and quality of the production processes with higher efficiency and
effectiveness. On the other hand important charge of the environment, reduced availability of natural
resources and the increasing growth of waste as well as energy use require new concepts and strategies to
recycle technical consumer goods as there are household instruments, consumer electronics and passenger
cars ‐ instead of land filling, burning or steel production a high potential of recycling is necessary. The
modern methods of QM, EM and EnM have been developed and refined in advanced manufacturing
systems and therefore there exists close interaction to intelligent metrology and industrial and
technological developments. Metrology is also devoted to the practice of measurement tasks. On the basis
of metrology essential measurement know‐how is developed and organisations are supplied with this
know‐how.

Schlagworte:
Precision metrology, Nanotechnology, Workpiece accuracy, Industrial environment, Advanced Multi‐Functions Integrated Industry, Integrated Management

Erstellt aus der Publikationsdatenbank der Technischen Universitšt Wien.