Publications in Scientific Journals:
J. Franco, S. Graziano, B. Kaczer, F. Crupi, L. Ragnarsson, T. Grasser, G. Groeseneken:
"BTI Reliability of Ultra-Thin EOT MOSFETs for Sub-Threshold Logic";
Microelectronics Reliability,
52
(2012),
1932
- 1935.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1016/j.microrel.2012.06.058
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2012/JB2012_Grasser_3.pdf
Created from the Publication Database of the Vienna University of Technology.