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Publications in Scientific Journals:

J. Franco, B. Kaczer, Ph. J. Roussel, J. Mitard, M. Cho, L. Witters, T. Grasser, G. Groeseneken:
"SiGe Channel Technology: Superior Reliability Toward Ultrathin EOT Devices-Part I: NBTI";
IEEE Transactions on Electron Devices, 60 (2013), 1; 396 - 404.



"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/TED.2012.2225625

Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2012/JB2012_Grasser_5.pdf


Created from the Publication Database of the Vienna University of Technology.