Talks and Poster Presentations (with Proceedings-Entry):
T. Grasser, H. Reisinger, K. Rott, M. Toledano-Luque, B. Kaczer:
"On the Microscopic Origin of the Frequency Dependence of Hole Trapping in pMOSFETs";
Talk: IEEE International Electron Devices Meeting (IEDM),
San Francisco, CA, USA;
2012-12-10
- 2012-12-12; in: "Proceedings of the IEEE International Electron Devices Meeting (IEDM)",
(2012),
470
- 473.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1109/IEDM.2012.6479076
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2012/CP2012_Grasser_2.pdf
Created from the Publication Database of the Vienna University of Technology.