Doctor's Theses (authored and supervised):
O. Triebl:
"Reliability Issues in High-Voltage Semiconductor Devices";
Supervisor, Reviewer: T. Grasser, M. Gröschl;
Institut für Mikroelektronik,
2012;
oral examination: 2012-10-24.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.34726/hss.2012.27576
Electronic version of the publication:
http://www.iue.tuwien.ac.at/phd/triebl/
Created from the Publication Database of the Vienna University of Technology.