Publications in Scientific Journals:
M. Toledano-Luque, B. Kaczer, T. Grasser, Ph. J. Roussel, J. Franco, G. Groeseneken:
"Toward a Streamlined Projection of Small Device Bias Temperature Instability Lifetime Distributions";
Journal of Vacuum Science & Technology B,
31
(2013),
1;
01A114-1
- 01A114-4.
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.1116/1.4772587
Electronic version of the publication:
http://www.iue.tuwien.ac.at/pdf/ib_2012/JB2013_Grasser_1.pdf
Created from the Publication Database of the Vienna University of Technology.