Talks and Poster Presentations (with Proceedings-Entry):
Y Voronko, G Eder, M Weiss, M Knausz, G Oreski, T. Koch, K Berger:
"Long Term Performance of PV Modules: System Optimization through the Application of Innovative Non-Destructive Characterization Methods";
Poster: 27th European Photovoltaic Solar Energy Conference and Exhibition,
Frankfurt;
2012-09-24
- 2012-09-28; in: "Proceedings",
(2012),
ISBN: 3-936338-28-0;
6 pages.
English abstract:
Innovative and highly sensitive analytical tools for the non-destructive detection and visualization of defects, delamination and material incompatibilities within the multi-material laminate of a PV-module are presented. The presence and position of physical imperfections such as delamination, voids or impurities within a module were determined with Pulse Thermography (PT) and Scanning Acoustic Microscopy (SAM). With SAM it is also possible to identify cracks within a wafer very accurately, as could be demonstrated in a comparative measurement with Electroluminescence (EL) experiments. For the non-destructive identification of chemical changes in the individual layers of a PV-module - caused by degradation, decomposition or impurities - confocal Raman microscopy has proven to be a very powerful tool.
Keywords:
photovoltaics, module, reliability, scanning acoustic microscopy, pulsed thermography
"Official" electronic version of the publication (accessed through its Digital Object Identifier - DOI)
http://dx.doi.org/10.4229/27thEUPVSEC2012-4BV.3.41
Created from the Publication Database of the Vienna University of Technology.